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题名: The Effect of Hole Depth on the Coercivity Distribution and Domain Structure for DyFeCo Thin Films
作者: Ye, L. X.;Lee, J. M.;Wu, Te-Ho;Wu, Jong-Ching
贡献者: 物理學系
日期: 2005
上传时间: 2014-06-06T07:18:30Z
出版者: American Institute of Physics
摘要: In our previous studies, we indicated that the coercivity of patterned magneto-optical thin film is quite different from nonpatterned samples. However, we only compared the hysteresis loop bulk measurements of the samples. In this study, we measured the microhysteresis curves at an arbitrary position while coercivity distribution was mapped, and observed submicron images of the remnant state of domain reversal patterns. The spatial variations of the coercivity over several depths of hole arrays barrier on patterned film will be reported.
關聯: Journal of Applied Physics, 97(10): 10J704
显示于类别:[物理學系] 期刊論文

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