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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/18539

Title: Investigation of Permalloy Cross Structure Using Magnetic Force Microscope and Magnetoresistance Measurement
Authors: Chang, Y. C.;Chang, C. C.;Chang, Ida;Wu, Jong-Ching;Wei, Zung-Hang;Lai, Mei-Feng;Chang, Ching-Ray
Contributors: 物理學系
Date: 2006
Issue Date: 2014-06-06T07:18:33Z
Publisher: American Institute of Physics
Abstract: Magnetic properties of microstructured Permalloy thin film cross have been studied using magnetic force microscopy and magnetoresistance measurement. Three types of magnetization configurations formed within the junction area were observed, including two kinds of magnetic pattern having two inward and two outward magnetizations and one with three outward and one inward magnetizations. The presence of those variant magnetic configurations gives rise to an irreversible magnetoresistance behavior originated from the distinct magnetization history. Asynchronous magnetization reversal of each arm provides a chance to manipulate the magnetic pattern of the cross.
Relation: Journal of Applied Physics, 99(8): 08B710
Appears in Collections:[物理學系] 期刊論文

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