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题名: Investigation of Permalloy Cross Structure Using Magnetic Force Microscope and Magnetoresistance Measurement
作者: Chang, Y. C.;Chang, C. C.;Chang, Ida;Wu, Jong-Ching;Wei, Zung-Hang;Lai, Mei-Feng;Chang, Ching-Ray
贡献者: 物理學系
日期: 2006
上传时间: 2014-06-06T07:18:33Z
出版者: American Institute of Physics
摘要: Magnetic properties of microstructured Permalloy thin film cross have been studied using magnetic force microscopy and magnetoresistance measurement. Three types of magnetization configurations formed within the junction area were observed, including two kinds of magnetic pattern having two inward and two outward magnetizations and one with three outward and one inward magnetizations. The presence of those variant magnetic configurations gives rise to an irreversible magnetoresistance behavior originated from the distinct magnetization history. Asynchronous magnetization reversal of each arm provides a chance to manipulate the magnetic pattern of the cross.
關聯: Journal of Applied Physics, 99(8): 08B710
显示于类别:[物理學系] 期刊論文


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