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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/18546

Title: Probing the Magnetization Reversal of Microstructured Permalloy Cross by Planar Hall Measurement and Magnetic Force Microscopy
Authors: Chang, Y. C.;Chang, C. C.;Wu, Jong-Ching;Wei, Z. H.;Lai, M. F.;Chang, C. R.
Contributors: 物理學系
Keywords: Hall effect devices;Magnetic force microscopy (MFM);Magnetic recording;Magnetoresistance
Date: 2006-10
Issue Date: 2014-06-06T07:18:39Z
Publisher: IEEE
Abstract: A local magnetization reversal of Permalloy cross has been studied by using magnetoresistance measurement and magnetic force microscope. An extraordinary change of the transverse voltage correlated with the planar Hall Effect was presented and evidenced by a series of MFM images which indicates that the rotation of magnetization within the joint area contributes to the significant voltage alteration
Relation: IEEE Transactions on Magnetics, 42(10): 2963-2965
Appears in Collections:[物理學系] 期刊論文

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