National Changhua University of Education Institutional Repository : Item 987654321/18546
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题名: Probing the Magnetization Reversal of Microstructured Permalloy Cross by Planar Hall Measurement and Magnetic Force Microscopy
作者: Chang, Y. C.;Chang, C. C.;Wu, Jong-Ching;Wei, Z. H.;Lai, M. F.;Chang, C. R.
贡献者: 物理學系
关键词: Hall effect devices;Magnetic force microscopy (MFM);Magnetic recording;Magnetoresistance
日期: 2006-10
上传时间: 2014-06-06T07:18:39Z
出版者: IEEE
摘要: A local magnetization reversal of Permalloy cross has been studied by using magnetoresistance measurement and magnetic force microscope. An extraordinary change of the transverse voltage correlated with the planar Hall Effect was presented and evidenced by a series of MFM images which indicates that the rotation of magnetization within the joint area contributes to the significant voltage alteration
關聯: IEEE Transactions on Magnetics, 42(10): 2963-2965
显示于类别:[物理學系] 期刊論文

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