National Changhua University of Education Institutional Repository : Item 987654321/18548
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题名: Fabrication and Characterization of Microstructured Magnetic Tunnel Junction Rings
作者: Chen, C. C.;Chang, C. C.;Kuo, C. Y.;Horng, Lance;Wu, Jong-Ching;Wu, Te-Ho;Chern, G.;Huang, C. Y.;Tsunoda, M.;Takahashi, M.
贡献者: 物理學系
关键词: Fabrication;Magnetic force microscopy (MFM);Magnetization reversal;Magnetoresistance
日期: 2006-10
上传时间: 2014-06-06T07:18:40Z
出版者: IEEE
摘要: Microstructured magnetic tunnel junction rings have been fabricated by a top-down technique combining electron beam lithography and ion milling process. Four-terminal magnetoresistance measurements and magnetic force microscopy were used to successfully explore a four-transition process within the free layer throughout the magnetization reversal. Various magnetization configurations were identified to be the onion state, vortex-pair state, vortex state, vortex-core state, and reverse onion state. In addition, the various durations of each magnetic state observed in the magnetoresistance curve can be utilized for the study of a coupling effect between the pinned layer and the free layer
關聯: IEEE Transactions on Magnetics, 42(10): 2766-2768
显示于类别:[物理學系] 期刊論文

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