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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/18556

Title: Investigation of the Cross-tie Wall Evolution by Using Magnetic Force Microscopy and Local Electrical Measurement
Authors: Chang, C. C.;Chang, Y. C.;Lo, I. C.;Wu, Jong-Ching
Contributors: 物理學系
Keywords: Permalloy ellipse;Cross-tie wall;MFM;Magnetoresistance
Date: 2007-03
Issue Date: 2014-06-06T07:18:46Z
Publisher: Elsevier
Abstract: Micron-sized permalloy ellipse was fabricated accordingly to form cross-tie walls at as-deposited state, in which the film thickness is 55 nm and the long and short axes are 4 and , respectively. Six non-magnetic current/voltage leads were patched on the ellipse to investigate the magnetization reversal. The transverse magnetoresistance (MR) curve measured with two outermost leads reveal several steps associated with the nucleation and annihilation of cross-tie walls. Probing individual segment of the ellipse makes it possible to classify the contributions of cross-tie wall to the MR. Magnetic force microscopy was utilized to confirm the evolution of cross-tie wall.
Relation: Journal of Magnetism and Magnetic Materials, 310(2) Part3: 2612-2614
Appears in Collections:[物理學系] 期刊論文

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