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Please use this identifier to cite or link to this item:
http://ir.ncue.edu.tw/ir/handle/987654321/18558
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| Title: | Controllable Remanent States on Microstructured Magnetic Tunnel Junction Rings |
| Authors: | Chen, C. C.;Chao, C. T.;Kuo, C.Y.;Horng, Lance;Wu, Te-Ho;Chern, G.;Huang, C. Y.;Isogami, S.;Tsunoda, M.;Takahashi, M.;Wu, Jong-Ching |
| Contributors: | 物理學系 |
| Keywords: | Magnetic tunneling junction (MTJ);Magnetoresistance;Multibit application;Ring-shaped cells |
| Date: | 2007-06
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| Issue Date: | 2014-06-06T07:18:47Z
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| Publisher: | IEEE |
| Abstract: | Controllable remanent states have been studied on the microstructured magnetic tunnel junction (MTJ) rings through magnetoresistance measurements. These rings were designed accordingly with an outer/inner diameter of 2/1 and 1/0.5 mum to reveal two and one metastable states, respectively, during the magnetization reversal process on the free layer. The distinct magnetoresistance levels based on the tunneling magnetoresistance effect are associated with the relative alignment of magnetization of free layer and pinned layer. As a result, four and three controllable remanent magnetic states on the free layer were manipulated by ramping external magnetic fields, applied in the biasing direction, with various field ranges, giving rise to four and three stable magnetoresistance values at zero field. These results may provide a great potential in magnetic multibit memory applications using ring-shaped cells |
| Relation: | IEEE Transactions on Magnetics, 43(6): 2824-2826 |
| Appears in Collections: | [物理學系] 期刊論文
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