English  |  正體中文  |  简体中文  |  Items with full text/Total items : 6469/11641
Visitors : 18488197      Online Users : 270
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search
LoginUploadHelpAboutAdminister

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/18586

Title: Effect of Silver Thickness on the Formation of Surface Plasmon Polaritons in Silver-Coated Silicon Nitride Photonic Crystal Slabs
Authors: Shyu, Jia-Hong;Ou, Neil;Chien, Jui-Hsing;Lee, Huang-Ming;Tai, Chao-Yi;Wu, Jong-Ching
Contributors: 物理學系
Date: 2010
Issue Date: 2014-06-06T07:19:17Z
Publisher: The Japan Society of Applied Physics
Abstract: A systematic study of the influence of silver film thickness on the transmittance spectra through a silicon nitride photonic crystal slab (SiN-PCS) coated with silver films of various thicknesses is presented. The transmission spectrum through a bare SiN-PCS reveals guided resonances. When an ultrathin silver film (<10 nm in thickness) is coated on a SiN-PCS, isolated silver nanoparticles are formed resulting in the suppression of guided resonances. In addition, a red shift is found in the optical transmittance spectra measured on SiN-PCS coated with a progressively thicker silver film. This may be attributed to the formation of localized surface plasmon resonances at the interface between silver nanoparticles and silicon nitride. A continuous texture is formed as the thickness of the silver film is increased up to 20 nm, resulting in a transition from localized surface plasmon resonances to surface plasmon polaritons. Furthermore, the surface plasmon polaritons that are formed externally (internally) are identified in SiN-PCS coated on one side (double sides) with a 20-nm-thick silver film.
Relation: Japanese Journal of Applied Physics, 49(6S): 06GG07
Appears in Collections:[物理學系] 期刊論文

Files in This Item:

File SizeFormat
index.html0KbHTML339View/Open


All items in NCUEIR are protected by copyright, with all rights reserved.

 


DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback