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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/18590

Title: Finite Element Analysis of Antireflective Silicon Nitride Sub-wavelength Structures for Solar Cell Applications
Authors: Lee, Huang-Ming;Sahoo, Kartika Chandra;Li, Yiming;Wu, Jong-Ching;Chang, Edward Yi
Contributors: 物理學系
Keywords: Silicon nitride;Sub-wavelength structure;Finite element simulation;Antireflection coating;Solar cell
Date: 2010-10
Issue Date: 2014-06-06T07:19:31Z
Publisher: Elsevier
Abstract: We numerically calculate the spectral reflectivity of the silicon nitride (Si3N4) sub-wavelength structure (SWS) using a two-dimensional finite element simulation. The geometry-dependent effective reflectance of the Si3N4 SWS over the wavelength ranging from 400 nm to 1000 nm is examined and the structure of Si3N4 SWS is further optimized for the lowest effective reflectance. A p–n junction solar cell efficiency based on the optimized Si3N4 SWS is also calculated, resulting in an improvement of 0.98% in efficiency than that of single layer antireflection coatings.
Relation: Thin Solid Films, 518(24): 7204-7208
Appears in Collections:[物理學系] 期刊論文

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