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题名: Finite Element Analysis of Antireflective Silicon Nitride Sub-wavelength Structures for Solar Cell Applications
作者: Lee, Huang-Ming;Sahoo, Kartika Chandra;Li, Yiming;Wu, Jong-Ching;Chang, Edward Yi
贡献者: 物理學系
关键词: Silicon nitride;Sub-wavelength structure;Finite element simulation;Antireflection coating;Solar cell
日期: 2010-10
上传时间: 2014-06-06T07:19:31Z
出版者: Elsevier
摘要: We numerically calculate the spectral reflectivity of the silicon nitride (Si3N4) sub-wavelength structure (SWS) using a two-dimensional finite element simulation. The geometry-dependent effective reflectance of the Si3N4 SWS over the wavelength ranging from 400 nm to 1000 nm is examined and the structure of Si3N4 SWS is further optimized for the lowest effective reflectance. A p–n junction solar cell efficiency based on the optimized Si3N4 SWS is also calculated, resulting in an improvement of 0.98% in efficiency than that of single layer antireflection coatings.
關聯: Thin Solid Films, 518(24): 7204-7208
显示于类别:[物理學系] 期刊論文


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