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Please use this identifier to cite or link to this item:
http://ir.ncue.edu.tw/ir/handle/987654321/18603
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| Title: | Current-in-plane Tunneling Measurement Through Patterned Contacts on Top Surfaces of Magnetic Tunnel Junctions |
| Authors: | Lee, Ching-Ming;Ye, Lin-Xiu;Lee, Jia-Mou;Lin, Yu-Cyun;Huang, Chao-Yuan;Wu, Jong-Ching;Tsunoda, Masakiyo;Takahashi, Migaku;Wu, Te-Ho |
| Contributors: | 物理學系 |
| Keywords: | Current-in-plane tunneling;Magnetic tunnel junctions;Magnetoresistance;Resistance-area product |
| Date: | 2011
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| Issue Date: | 2014-06-06T07:20:03Z
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| Publisher: | The Korean Magnestics Society |
| Abstract: | This study reports an alternative method for measuring the magnetoresistance of unpatterned magnetic tunnel junctions similar to the current-in-plane tunneling (CIPT) method. Instead of using microprobes, a series of point contacts with different spacings are coated on the top surface of the junctions and R-H loops at various spacings are then measured by the usual four-point probe method. The values of magnetoresistance and resistance-area products can be obtained by fitting the measured data to the CIPT theoretical model. The test results of two types of junctions were highly similar to those obtained from standard CIPT tools. The proposed method may help to accelerate the process for evaluating the quality of magnetic tunnel junctions when commercial CIPT tools are not accessible. |
| Relation: | Journal of Magnetics, 16(2): 169-172 |
| Appears in Collections: | [物理學系] 期刊論文
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