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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/18608

Title: A New Technique for Defect Characterization Using One Dimensional Systems
Authors: Smith, D. D.;Wybourne, M. N.;Wu, Jong-Ching;DeAnni, A.;Chang, W. H.
Contributors: 物理學系
Date: 1992
Issue Date: 2014-07-01T08:03:26Z
Relation: presented at Atomic and Nanoscale Modification of Materials: Fundamentals and ApplicationVentura, CA
Appears in Collections:[物理學系] 會議論文

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