National Changhua University of Education Institutional Repository : Item 987654321/18608

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NCUEIR > College of Science > Department of Physics > Proceedings > Item 987654321/18608

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/18608

Title:	A New Technique for Defect Characterization Using One Dimensional Systems
Authors:	Smith, D. D.;Wybourne, M. N.;Wu, Jong-Ching;DeAnni, A.;Chang, W. H.
Contributors:	物理學系
Date:	1992
Issue Date:	2014-07-01T08:03:26Z
Relation:	presented at Atomic and Nanoscale Modification of Materials: Fundamentals and ApplicationVentura, CA
Appears in Collections:	[Department of Physics] Proceedings

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