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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/18758

Title: Fast Measurement in Submicron Magnetic Tunnel Junctions
Authors: Chao, C. T.;Kuo, C. Y.;Chen, C. C.;Horng, Lance;Wu, Te-Ho;Tsunoda, M.;Takahashi, M.;Wu, Jong-Ching
Contributors: 物理學系
Date: 2009
Issue Date: 2014-07-01T08:05:20Z
Relation: presented at annual meeting of Chinese Physical Society
Appears in Collections:[物理學系] 會議論文

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