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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/18801

Title: Current-induced Switching of Exchange Bias in Nano-scaled Magnetic Tunnel Junctions with Saf Pinned Layer
Authors: Kuo, C. Y.;Chao, C. T.;Horng, Lance;Wu, Jong-Ching;Tsunoda, M.;Takahashi, M.
Contributors: 物理學系
Date: 2012
Issue Date: 2014-07-01T08:05:46Z
Relation: presented at annual meeting of Chinese Physical Society
Appears in Collections:[物理學系] 會議論文

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