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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/19105

Title: A Token Scan Architecture for Low Power Testing
Authors: Huang, Tsung-Chu;Lee, Kuen-Jong
Contributors: 電子工程學系
Date: 2001
Issue Date: 2014-10-27T08:08:06Z
Abstract: This paper presents a novel scan architecture for low-power testing, which employs the techniques of multiphase clocking, token ring, and clockgating. When the multiphase clocking technique is directly employed to a scan chain, inter-phase skews and large routing area will be the problems. We develop a token scan cell design to address these problems. To reduce the power dissipation due to the clock and scan-in data trees, we propose a novel clockgating technique that takes the advantage of the regularity and periodicity of the token scan chain. Combining the three techniques, the token scan architecture can efficiently reduce the data transitions in the scan circuits as well as the switching activity in both the clock and the scan-in data trees. From experiments, more than 95% of power reduction can be achieved for most circuits with long scan chains.
Relation: 2001 IEEE International Test Conference, : 660-669
Appears in Collections:[電子工程學系] 會議論文

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