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题名: A Supply-Gating Scheme for Both Data-Retention and Spike-Reduction in Power Management and Test Scheduling
作者: Huang, Tsung-Chu;Tzeng, Jing-Chi;Chao, Yuan-Wei;Chen, Ji-Jan;Liu, Wei-Ting;Lee, Kuen-Jong
贡献者: 電子工程學系
日期: 2006-04
上传时间: 2014-10-27T08:08:10Z
出版者: IEEE
摘要: Power gating using sleep transistors is a trend for power management and test scheduling in the deep-submicron and even nanometer resolutions. This paper develops a sleep transistor allocation structure that can not only reduce the spike-time product with data retention but also balance the noise margins and timing in active mode. A switching activity based model is developed as a heuristics for sleep transistor clustering. Under the proposed model, the spike reduction can be up to 83% in average
關聯: 2006 International Symposium on VLSI Design, Automation and Test(VLSI-DAT), : 167-170
显示于类别:[電子工程學系] 會議論文


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