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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/19110

Title: IDDS Testing for Nanotechnologies
Authors: Huang, Tsung-Chu;Li, Ling;Chao, Yuan-Wei
Contributors: 電子工程學系
Date: 2006-08
Issue Date: 2014-10-27T08:08:11Z
Publisher: 清華大學
Relation: The 17th VLSI Design/CAD Symposium, : 707-710
Appears in Collections:[電子工程學系] 會議論文

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