National Changhua University of Education Institutional Repository : Item 987654321/19110

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NCUEIR > College of Engineering > eedept > Proceedings > Item 987654321/19110

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/19110

Title:	IDDS Testing for Nanotechnologies
Authors:	Huang, Tsung-Chu;Li, Ling;Chao, Yuan-Wei
Contributors:	電子工程學系
Date:	2006-08
Issue Date:	2014-10-27T08:08:11Z
Publisher:	清華大學
Relation:	The 17th VLSI Design/CAD Symposium, : 707-710
Appears in Collections:	[eedept] Proceedings

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