English  |  正體中文  |  简体中文  |  Items with full text/Total items : 6480/11652
Visitors : 20122308      Online Users : 205
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search
LoginUploadHelpAboutAdminister

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/19111

Title: A High-Resolution Current Test Scheme for Nanotechnologies
Authors: Huang, Tsung-Chu;Li, Ling
Contributors: 電子工程學系
Date: 2006-10
Issue Date: 2014-10-27T08:08:11Z
Relation: IEEE International Workshop on Current and Defect Based Test in conjunction with ITC, : 25-28
Appears in Collections:[電子工程學系] 會議論文

Files in This Item:

There are no files associated with this item.



All items in NCUEIR are protected by copyright, with all rights reserved.

 


DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback