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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/19111

Title: A High-Resolution Current Test Scheme for Nanotechnologies
Authors: Huang, Tsung-Chu;Li, Ling
Contributors: 電子工程學系
Date: 2006-10
Issue Date: 2014-10-27T08:08:11Z
Relation: IEEE International Workshop on Current and Defect Based Test in conjunction with ITC, : 25-28
Appears in Collections:[電子工程學系] 會議論文

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