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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/19115

Title: Design for Fast and High-Resolution Current Testability of SRAM in Nanotechnology
Authors: Chao, Yuan-Wei;Huang, Tsung-Chu
Contributors: 電子工程學系
Date: 2007-11
Issue Date: 2014-10-27T08:08:25Z
Relation: IEEE Workshop on Consumer Electronics and Signal Processing, : 545-549
Appears in Collections:[電子工程學系] 會議論文

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