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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/19120

Title: MTCMOS SRAM Design for Data-Retention and High-Resolution Current Test
Authors: Chen, Chih-Jong;Huang, Tsung-Chu
Contributors: 電子工程學系
Date: 2008-07
Issue Date: 2014-10-27T08:08:29Z
Relation: The 2nd VLSI Test Technology Workshop, : 20-25
Appears in Collections:[電子工程學系] 會議論文

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