National Changhua University of Education Institutional Repository : Item 987654321/19120

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NCUEIR > College of Engineering > eedept > Proceedings > Item 987654321/19120

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/19120

Title:	MTCMOS SRAM Design for Data-Retention and High-Resolution Current Test
Authors:	Chen, Chih-Jong;Huang, Tsung-Chu
Contributors:	電子工程學系
Date:	2008-07
Issue Date:	2014-10-27T08:08:29Z
Relation:	The 2nd VLSI Test Technology Workshop, : 20-25
Appears in Collections:	[eedept] Proceedings

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