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NCUEIR > College of Engineering > eedept > Proceedings >  Item 987654321/19126

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/19126

Title: Low-Cost CLT-based Random Number Generator for Communication Test
Authors: Chou, Yi-Hsien;Wu, Tsu-Hsin;Huang, Tsung-Chu
Contributors: 電子工程學系
Date: 2009-07
Issue Date: 2014-10-27T08:08:34Z
Relation: The 3rd VLSI Test Technology Workshop, : 79-82
Appears in Collections:[eedept] Proceedings

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