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题名: Distribution-Compensable Jitter Generator for Communication Test
作者: Chou, Yi-Hsien;Wu, Tsu-Hsin;Chen, Pin-Chung;Huang, Tsung-Chu
贡献者: 電子工程學系
关键词: Jitter generation;Random number generator;Normal distribution;Bit-error-rate test;Communication test
日期: 2009-08
上传时间: 2014-10-27T08:08:35Z
出版者: 中央大學
摘要: A distribution-compensable methodology is pro-posed for calibrating the non-ideality of digital-to-time converters by adjusting the given distribution of random number generators. For generating every cycle in built-in communication test, a fast and area-efficient piecewise-line random number generator is developed. The speedup and reduction can be obviously estimated from the proposed algorithms. The effectiveness and efficiency of compensation is clearly validated by nine examples with different bench distributions and bench converters.
關聯: The 20th VLSI Design and CAD Symposium, : 574-577
显示于类别:[電子工程學系] 會議論文


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