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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/19131

Title: Area-Efficient High Goodness-of-Fit Noise Generator for Communication Test
Authors: Chen, Pin-Chung;Fan, Sheng-Jie;Wang, Yun-Ping;Kao, Yung-Sheng;Huang, Tsung-Chu
Contributors: 電子工程學系
Date: 2010-08
Issue Date: 2014-10-27T08:08:39Z
Relation: The 4th VLSI Test Technology Workshop, S3-2
Appears in Collections:[電子工程學系] 會議論文

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