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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/19133

Title: A High-Yield Architecture for Memory Repairing
Authors: Lu, Kwei-Yeh;Huang, Yen-Chieh;Huang, Tsung-Chu
Contributors: 電子工程學系
Date: 2010-11
Issue Date: 2014-10-27T08:08:41Z
Publisher: 南台科技大學
Relation: 2010 Workshop on Consumer Electronics, : 835-842
Appears in Collections:[電子工程學系] 會議論文

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