National Changhua University of Education Institutional Repository : Item 987654321/19133

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NCUEIR > College of Engineering > eedept > Proceedings > Item 987654321/19133

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/19133

Title:	A High-Yield Architecture for Memory Repairing
Authors:	Lu, Kwei-Yeh;Huang, Yen-Chieh;Huang, Tsung-Chu
Contributors:	電子工程學系
Date:	2010-11
Issue Date:	2014-10-27T08:08:41Z
Publisher:	南台科技大學
Relation:	2010 Workshop on Consumer Electronics, : 835-842
Appears in Collections:	[eedept] Proceedings

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