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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/19143

Title: 系統晶片之低功耗測試與設計整合技術研究
Authors: 黃宗柱
Contributors: 電子工程學系 
Date: 2005
Issue Date: 2014-10-27T08:08:53Z
Publisher: 工研院
Relation: 工研院計畫, 計畫編號: ITRI-S3-S94S02
Appears in Collections:[電子工程學系] 其他研究報告

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