National Changhua University of Education Institutional Repository : Item 987654321/15411

English | 正體中文 | 简体中文 | Items with full text/Total items : 6507/11669
Visitors : 30498351 Online Users : 653

RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.

Scope Adv. Search

Login ‧ Upload ‧ Help ‧ About ‧ Administer

NCUEIR > College of Science > Department of Physics > Periodical Articles > Item 987654321/15411

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/15411

Title:	Hopping Conduction Behavior with the Coulomb Effects in Colossal Magnetoresistance Materials
Authors:	Lin, C. H.;Young, S. L.;Chen, H. Z.;Kao, M. C.;Horng, Lance
Contributors:	物理學系
Date:	2007-12
Issue Date:	2013-02-05T02:19:44Z
Publisher:	WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Abstract:	We report on the temperature dependence of resistivity in La0.7–xPrxPb0.3MnO3 (x =0, 0.5, 0.7) bulk samples in order to explore the hopping transport behavior with the Coulomb effects for the colossal magnetoresistance materials. The experimental observations in La0.7–xPrxPb0.3MnO3 (x =0.5, 0.7) bulk samples reveal the exponential temperature dependence of resistivity ϱ (T) ∞ exp [(T1/T)n] with n = 1/2, when system was the paramagnetic (PM) insulator at the high temperature range (T>Tp). Evidence for the hopping conduction with Coulomb effects is presented By using the approximate method of the VRH conduction in the localization regime base on Efros and Shklovskii model [A. L. Efros and B. I. Shklovskii, J. Phys. C, Solid State Phys. 8, L49 (1975)], the localization length of eg electrons can be estimated with the relationship, ξ=2.8e2/(4πε0κkBT1). The reasonable results of localization length can be evaluated to explain the possibility of the presence of the Coulomb interactions in these CMR materials.
Relation:	physica status solidi (b), 244(12): 4415-4418
Appears in Collections:	[Department of Physics] Periodical Articles

Files in This Item:

File	Size	Format
index.html	0Kb	HTML	609	View/Open