National Changhua University of Education Institutional Repository : Item 987654321/15916
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 6507/11669
造访人次 : 30130731      在线人数 : 510
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜寻范围 进阶搜寻

jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://ir.ncue.edu.tw/ir/handle/987654321/15916

题名: The Conceptualization and Measurement of M-Commerce User Satisfaction
作者: Wang, Yi-Shun;Liao, Yi-Wen
贡献者: 資訊管理學系
关键词: Mobile commerce;User satisfaction;Measurement;Instrument development
日期: 2007-01
上传时间: 2013-04-22T07:34:34Z
出版者: Elsevier
摘要: Many of the instruments for measuring user-perceived system quality and user information satisfaction were developed in the context of mainframe, PC and wire-based technologies of a bygone era. With the proliferation of wireless technologies, users are increasingly interfacing and interacting with mobile commerce (m-commerce) systems. It is therefore important to develop new instruments and scales, which are directly targeted for these new interfaces and applications. User satisfaction is commonly acknowledged as one of the useful proxy measures of system success. This study addresses the concern for an effective m-commerce system design by means of the conceptualization and measurement of an m-commerce user satisfaction (MCUS) construct. In this article, we introduce and define this construct of MCUS, provide empirical validation of the construct and its underlying dimensionality, develop a standardized instrument with desirable psychometric properties for measuring MCUS, and explore the measure’s theoretical and practical application. This empirically validated instrument will be useful to researchers in developing and testing m-commerce systems theories, as well as to organizations in designing better-accepted m-commerce systems.
關聯: Computers in Human Behavior, 23(1): 381-398
显示于类别:[資訊管理學系所] 期刊論文

文件中的档案:

档案 大小格式浏览次数
index.html0KbHTML722检视/开启


在NCUEIR中所有的数据项都受到原著作权保护.

 


DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 回馈