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Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/17477

Title: The Characterization of Mg Implanted GaN Material
Authors: Tsai, C. D.;Lin, Yow-Jon;Lee, C. T.
Contributors: 光電科技研究所
Date: 1999
Issue Date: 2013-10-02T08:38:49Z
Publisher: Progress in Electromagnetics Research Symposium(PIERS)
Relation: Progress in Electromagnetics Research Symposium(PIERS), : 529
Appears in Collections:[光電科技研究所] 會議論文

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