National Changhua University of Education Institutional Repository : Item 987654321/19082
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题名: Token Scan Cell for Low Power Testing
作者: Huang, Tsung-Chu;Lee, Kuen-Jong
贡献者: 電子工程學系　
日期: 2001-05
上传时间: 2014-10-27T08:06:18Z
出版者: Institution of Engineering and Technology
摘要: A multiphase clocking technique is presented for reducing the test power for scan-based circuits. A novel scan cell design called the token scan cell is developed, which combines a phase-generating flip-flop and a data flip-flop to overcome the inter-phase skew and clock routing problems. Experimental results show that on average ∼87% of the data transition count during scanning is reduced. For many circuits with long chains, a reduction of >98% can even be achieved.
關聯: Electronics Letters, 37(11): 678-679
显示于类别:[電子工程學系] 期刊論文

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