National Changhua University of Education Institutional Repository : Item 987654321/19111

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NCUEIR > College of Engineering > eedept > Proceedings > Item 987654321/19111

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/19111

Title:	A High-Resolution Current Test Scheme for Nanotechnologies
Authors:	Huang, Tsung-Chu;Li, Ling
Contributors:	電子工程學系
Date:	2006-10
Issue Date:	2014-10-27T08:08:11Z
Relation:	IEEE International Workshop on Current and Defect Based Test in conjunction with ITC, : 25-28
Appears in Collections:	[eedept] Proceedings

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