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題名: Distribution-Compensable Jitter Generator for Communication Test
作者: Chou, Yi-Hsien;Wu, Tsu-Hsin;Chen, Pin-Chung;Huang, Tsung-Chu
貢獻者: 電子工程學系
關鍵詞: Jitter generation;Random number generator;Normal distribution;Bit-error-rate test;Communication test
日期: 2009-08
上傳時間: 2014-10-27T08:08:35Z
出版者: 中央大學
摘要: A distribution-compensable methodology is pro-posed for calibrating the non-ideality of digital-to-time converters by adjusting the given distribution of random number generators. For generating every cycle in built-in communication test, a fast and area-efficient piecewise-line random number generator is developed. The speedup and reduction can be obviously estimated from the proposed algorithms. The effectiveness and efficiency of compensation is clearly validated by nine examples with different bench distributions and bench converters.
關聯: The 20th VLSI Design and CAD Symposium, : 574-577
顯示於類別:[電子工程學系] 會議論文


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