資料載入中.....
|
請使用永久網址來引用或連結此文件:
http://ir.ncue.edu.tw/ir/handle/987654321/11926
|
題名: | Intensity Noise Distribution of Semiconductor Lasers Measured Using Bit-Error-Rate Testers |
作者: | Chen, Kuo-Liang;Wang, Charlie;Wilks, John |
貢獻者: | 電機工程系 |
日期: | 2006-10
|
上傳時間: | 2012-07-03T01:44:23Z
|
出版者: | Institute of Electrical and Electronics Engineers Inc. |
摘要: | Laser noise has been well studied both theoretically and experimentally. Most of the previous experimental work examined the standard deviation of the noise, with the implicit assumption of a Gaussian noise distribution. We employ a new approach to measure the semiconductor laser noise distribution down to a bit-error ratio (BER) of 10-11. This method takes advantage of the high sampling rate of modern BER testers. We found that the noise distribution for a 1310-nm Fabry-P�rot laser and a 1550-nm distributed-feedback laser are well fitted by Gaussian distributions. |
關聯: | IEEE Photonics Technology Letters, 18(19): 2059-2061 |
顯示於類別: | [電機工程學系] 期刊論文
|
文件中的檔案:
檔案 |
大小 | 格式 | 瀏覽次數 |
index.html | 0Kb | HTML | 588 | 檢視/開啟 |
|
在NCUEIR中所有的資料項目都受到原著作權保護.
|