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Please use this identifier to cite or link to this item:
http://ir.ncue.edu.tw/ir/handle/987654321/11926
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| Title: | Intensity Noise Distribution of Semiconductor Lasers Measured Using Bit-Error-Rate Testers |
| Authors: | Chen, Kuo-Liang;Wang, Charlie;Wilks, John |
| Contributors: | 電機工程系 |
| Date: | 2006-10
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| Issue Date: | 2012-07-03T01:44:23Z
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| Publisher: | Institute of Electrical and Electronics Engineers Inc. |
| Abstract: | Laser noise has been well studied both theoretically and experimentally. Most of the previous experimental work examined the standard deviation of the noise, with the implicit assumption of a Gaussian noise distribution. We employ a new approach to measure the semiconductor laser noise distribution down to a bit-error ratio (BER) of 10-11. This method takes advantage of the high sampling rate of modern BER testers. We found that the noise distribution for a 1310-nm Fabry-P�rot laser and a 1550-nm distributed-feedback laser are well fitted by Gaussian distributions. |
| Relation: | IEEE Photonics Technology Letters, 18(19): 2059-2061 |
| Appears in Collections: | [電機工程學系] 期刊論文
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