English  |  正體中文  |  简体中文  |  Items with full text/Total items : 6481/11653
Visitors : 23354713      Online Users : 224
RC Version 3.2 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search
LoginUploadHelpAboutAdminister

Please use this identifier to cite or link to this item: http://ir.ncue.edu.tw/ir/handle/987654321/11926

Title: Intensity Noise Distribution of Semiconductor Lasers Measured Using Bit-Error-Rate Testers
Authors: Chen, Kuo-Liang;Wang, Charlie;Wilks, John
Contributors: 電機工程系
Date: 2006-10
Issue Date: 2012-07-03T01:44:23Z
Publisher: Institute of Electrical and Electronics Engineers Inc.
Abstract: Laser noise has been well studied both theoretically and experimentally. Most of the previous experimental work examined the standard deviation of the noise, with the implicit assumption of a Gaussian noise distribution. We employ a new approach to measure the semiconductor laser noise distribution down to a bit-error ratio (BER) of 10-11. This method takes advantage of the high sampling rate of modern BER testers. We found that the noise distribution for a 1310-nm Fabry-P�rot laser and a 1550-nm distributed-feedback laser are well fitted by Gaussian distributions.
Relation: IEEE Photonics Technology Letters, 18(19): 2059-2061
Appears in Collections:[電機工程學系] 期刊論文

Files in This Item:

File SizeFormat
index.html0KbHTML451View/Open


All items in NCUEIR are protected by copyright, with all rights reserved.

 


DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback